FAILURE EVENTS TREND ANALYSIS OF COMPUTER SYSTEMS IN NIGERIA

Authors

  • O. A. OLUWATOPE Department of Computer Science and Engineering, Obafemi Awolowo University, Ile-Ife. Author
  • G. A. ADEROUNMU Department of Computer Science and Engineering, Obafemi Awolowo University, Ile-Ife. Author
  • T. O. OYEBISI Technology Planning Unit, Faculty of Technology, Obafemi Awolowo University, Ile-Ife. Author

Keywords:

Failure Events, Viability, Weighted average, MTTR, MTBF, MTTD, Median Value Policy Issues

Abstract

The paper discusses the failure events trend analysis of computer systems and peripherals in developing countries taking the Nigerian experience as a case study. We identified and considered the manner and effects of failure events using empirical method to evaluate the quantities mean time to repair and mean time to (MTTR and MTTD). The data obtained were analysed using the method of weighted average which was employed to compute failure probabilities.

The results of this research shows that computer systems and peripherals in developing countries, especially, in Nigeria failed largely as a result of a significantly noticeable reduction in quality control substances included in the design recently manufactured and imported computer systems and peripherals.

Downloads

Published

2006-06-30

Issue

Vol. 41 No. 2 (2006): NSE TECHNICAL TRANSACTION JOURNAL (NSE TT-J)

Section

Articles